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April 2013   

Calendar

LASER World of Photonics
Booth B1.409
May 13-16, 2013
Munich, Germany
LASER website

CODE V Regional User Group Meeting
June 11, 2013
Pasadena, CA
More information

CODE V Regional User Group Meeting
June 13, 2013
Mountain View, CA
More information

CODE V Regional User Group Meeting
June 18, 2013
Rochester, NY
More information

SPIE Optics + Photonics
Booth 1116
August 25-29, 2013
San Diego, CA
SPIE website

Introduction to CODE V
September 16-20, 2013
Pasadena, CA
More information

Advanced Topics in CODE V
September 23-27, 2013
Pasadena, CA
More information

 

For a complete list of CODE V events worldwide, visit our Web site:

In this issue:

Quick Tip: Overlaying Detector Dimensions and Airy Disks on Spot Diagrams

A spot diagram option is a great way to analyze the structure of a geometrical spot created by your lens system and visualize the relative magnitude of various aberrations. The CODE V Spot Diagram (Analysis > Geometrical > Spot Diagram menu) option traces a grid of rays through the lens' entrance pupil and plots each ray's position on the image plane. The ray pattern on the entrance pupil can be rectilinear, circular, or random. In addition to the spot diagram itself, numerical metrics like the RMS spot diameter, 100% spot diameter, and the centroid displacement from the chief ray position on the image surface are also reported.

These metrics are handy, and you can gain additional insight by overlaying a user-sized detector and/or an Airy-disk-sized circle to compare against the spot's dimensions. The overlay controls are available in the Annotations/Overlays tab, where you specify the Airy disk overlay as well as the size and shape of a detector overlay (rectangular or circular), and whether the overlay is centered around the chief ray, spot centroid, or some other user-defined center.


These overlays provide a relative comparison to help you quickly determine whether your lens creates an image spot that will fit within some specified dimension, or whether your lens is close to diffraction limited (i.e., the pattern is similar in size to the Airy disk diameter, although the generally accepted criterion is the RMS wavefront error). Remember though, diffraction effects aren't considered in the Spot Diagram option, so if your lens is approaching the diffraction limit, you should include diffraction effects by using the Point Spread Function (PSF) option or Beam Synthesis Propagation (BSP) option instead of Spot Diagram.


Click to enlarge image

CODE V Regional User Group Meetings Coming in June

Our annual CODE V User Group meetings are coming up in June. These free, one-day meetings will be held in Pasadena, CA (June 11), Mountain View, CA (June 13), and Rochester, NY (June 18). Join us for lectures, discussions, and presentations developed by OSG's technical support and engineering staff. View the schedule and agenda.

To confirm your attendance, register online, send an email to ora_support@synopsys.com, or call 626-795-9101.

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