Calendar

CODE V User Group Meetings
June 2008 dates
California and New York
Click here for details and to enroll

Introduction to CODE V
Sept. 29-Oct. 3, 2008
Pasadena, California
Click here for details and to enroll

Advanced Topics in CODE V October 6-10, 2008
Pasadena, California
Click here for details and to enroll

Introduction to CODE V
Nov. 3-4, 2008
Salzburg, Austria
Contact Light Tec for registration

CODE V User Day
Nov. 5, 2008
Salzburg, Austria
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Selected Advanced Topics in CODE V
Nov. 6-7, 2008
Salzburg, Austria
Contact Light Tec for registration

For more international events and training, see our Events page

An Overview of CODE V 9.82

CODE V 9.82 began shipping in late May.  If you have not already received your update, it should arrive soon.  This update to CODE V includes the following enhancements:

• Spot Diagram: Several enhancements have been made to CODE V's Spot Diagram (SPO) feature.
  • New ray grid density controls which allow you to specify the desired accuracy level for the RMS spot size.  Separate controls are available for the spot size computation and graphical output.
  • The SPO option now outputs the 100% spot diameter, in addition to the RMS spot diameter.  These values can also be displayed in the graphical output along with lens name, date, and designer initials.
  • Ray patterns used in SPO can now be defined as circular or quasi-random (Sobol), in addition to a rectangular grid.
  • An Airy disk and/or detector size can be overlaid on the SPO diagram.
  • New macro functions, RMSSPOT and SPOTDATA, provide macro access to SPO data

• GRIN Materials and NS Surfaces: Several enhancements have been made to make it easier to use gradient index materials in non-sequential systems.
  
  
• Odd Polynomial (SPS ODD) and Zernike Polynomial (SPS ZRN) Surface 1st Order Ray Tracing: Quadratic aspheric terms for these surface types are now included in first order ray tracing.  This impacts paraxial properties, 3rd, 5th, and 7th order diagnostic aberration computations, and paraxial solves (real ray tracing always included these terms).
  
  
• Polarization Ray Tracing: A 50% ray tracing speed enhancement has been made for lens models where polarization ray tracing is enabled.
  
  
• Environmental Modeling: A new macro, DNDTCALC.SEQ, has been added.  This macro calculates the absolute dn/dT values for Schott and Ohara glasses for use in the Environmental Change (ENV) option.
  
  
• Bug Fixes: Several customer reported bugs have been fixed in this update.

A recorded demonstration of the new features in CODE V 9.82 is available for viewing on ORA's Customer Service Web site, www.oraservice.com, under CODE V Support > Webinar Recordings & Demos.

Updates to ORA's Customer Service Web Site

The following additions have been recently made to ORA's Customer Service area of the web, www.oraservice.com, under CODE V Support:

• The May issue of CODE V Enews, which features 3 macros frequently used by ORA Tech Support and Engineering, has been added under CODE V Enews & Tips.
  
  
• The GHOST_VIEW macro, used to perform real ray ghost image analysis, has been updated to include graphical output produced by CODE V's Illumination analysis (LUM) option.  The updated copy can be found under Macros & User-defined Feature Downloads > Updated Macros.
  
  
• A copy of a technical paper written by ORA's Dr. J. Michael Rodgers, "Control of Packaging Constraints in the Optimization of Unobscured Reflective Systems", has been added under Technical Papers.